The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 27, 2023

Filed:

Apr. 13, 2020
Applicant:

Milwaukee Electric Tool Corporation, Brookfield, WI (US);

Inventors:

Kris Kanack, Whitewater, WI (US);

Sean T. Kehoe, Waukesha, WI (US);

Paige Bovard, Milwaukee, WI (US);

Alex Huber, Milwaukee, WI (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B25B 23/145 (2006.01); B25B 27/10 (2006.01); B21D 39/04 (2006.01); B23D 17/06 (2006.01); H01R 43/042 (2006.01);
U.S. Cl.
CPC ...
B25B 23/1456 (2013.01); B25B 27/10 (2013.01); B21D 39/048 (2013.01); B23D 17/06 (2013.01); H01R 43/0427 (2013.01);
Abstract

A power tool system includes a hydraulic power tool. The hydraulic power tool includes a hydraulic drive, a sensor, and a first electronic processor. The sensor is configured to detect an operational parameter of the hydraulic drive during an operation by the hydraulic drive. The first electronic processor is configured to store a plurality of data points based on the operational parameter detected during the operation and send the plurality of data points to an external device. The external device includes a display screen and a second electronic processor configured to receive the plurality of data points from the hydraulic power tool, control the display screen to display an expected data point for the operational parameter for the operation, and control the display screen to display an actual data curve based on the plurality of data points, the actual data curve overlaid on the expected data point.


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