The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 27, 2023
Filed:
Jul. 06, 2022
Step Analysis Llc, Baltimore, MD (US);
Uri Tasch, Baltimore, MD (US);
Jason Dunthorn, Baltimore, MD (US);
STEP ANALYSIS LLC, Baltimore, MD (US);
Abstract
Disclosed herein is a gait analysis apparatus that is configured to provide multidimensional measures of the gait of an individual as the individual traverses the gait analysis apparatus. The gait analysis apparatus may be configured to provide a gait measuring processing device with the multidimensional measurements. Based on the multidimensional measurements, the gait measuring process device may, for example, diagnose the test subject with lameness or particular neuromuscular dysfunctions (NM) disease and/or injury, monitor progression of lameness or a particular NM disease and/or injury over time, determine a static weight as the test subject is traversing, monitor the static weight of the test subject over an extended period time, and/or determine which measurements may be used as biomarkers to identify lameness or the particular NM disease and/or injury. A system including a gait analysis apparatus is also disclosed.