The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 27, 2023
Filed:
Apr. 22, 2020
Applicant:
Topcon Corporation, Tokyo, JP;
Inventors:
Zaixing Mao, Tokyo, JP;
Zhenguo Wang, Ridgewood, NJ (US);
Bin Cao, Wayne, NJ (US);
Kinpui Chan, Ridgewood, NJ (US);
Assignee:
TOPCON CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/45 (2006.01); A61B 3/10 (2006.01); A61B 3/00 (2006.01); A61B 3/14 (2006.01); G01B 9/02 (2022.01); G01B 11/06 (2006.01);
U.S. Cl.
CPC ...
A61B 3/101 (2013.01); A61B 3/0025 (2013.01); A61B 3/14 (2013.01); G01B 9/02041 (2013.01); G01B 9/02083 (2013.01); G01B 11/06 (2013.01); G01J 3/45 (2013.01);
Abstract
A method for determining thickness of layers of the tear film includes reconstructing a full- or hyper-spectral interference pattern from an imaged multi-spectral pattern. Tear film thickness can then be estimated from the full- or hyper-spectral interference pattern. Using a full- or hyper-spectral interference pattern provides a greater number of frequency sampling points for increased tear film thickness estimation accuracy, without traditional time consuming techniques.