The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 20, 2023

Filed:

Jun. 14, 2019
Applicant:

Samsung Electronics Co., Ltd., Gyeonggi-do, KR;

Inventors:

Eunyong Kim, Gyeonggi-do, KR;

Daeyoung Seol, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/10 (2009.01); H04B 17/27 (2015.01); H04B 17/345 (2015.01); H04B 17/364 (2015.01); H04L 5/00 (2006.01);
U.S. Cl.
CPC ...
H04W 24/10 (2013.01); H04B 17/27 (2015.01); H04B 17/345 (2015.01); H04B 17/364 (2015.01); H04L 5/0048 (2013.01); H04L 5/0069 (2013.01);
Abstract

The present disclosure relates to a method for controlling interference measurement by an interference measurement control device, the method comprising the steps of: calculating distance information between a transmission side transmitting a reference signal for interference measurement and a reception side receiving the reference signal; calculating, on the basis of the distance information, signal delay information related to a delay time required until the reference signal transmitted from the transmission side arrives at the reception side; and determining control information for the transmission side or the reception side on the basis of the signal delay information.


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