The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 20, 2023

Filed:

Jul. 16, 2021
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Ori Barak, Beer Sheva, IL;

Gideon Shlomo Kutz, Ramat Hasharon, IL;

Assaf Touboul, Netanya, IL;

Amit Bar-Or Tillinger, Tel-Aviv, IL;

Ori Ben Shahar, Petach Tikva, IL;

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/10 (2009.01); H04L 5/00 (2006.01); H04B 17/309 (2015.01); H04W 24/08 (2009.01); H04L 25/02 (2006.01);
U.S. Cl.
CPC ...
H04W 24/08 (2013.01); H04B 17/309 (2015.01); H04L 5/0048 (2013.01); H04L 25/0228 (2013.01);
Abstract

Methods, systems, and devices for wireless communications are described. The method includes receiving, from a base station, control signaling identifying a measurement configuration for one or more non-linear estimation measurements of reference signals associated with a power amplifier configuration of the base station, receiving, from the base station, the reference signals on a set of resources identified by the measurement configuration, performing one or more non-linear estimation measurements associated with the power amplifier configuration of the base station based on the received reference signals, and transmitting, to the base station according to the measurement configuration, a measurement report based on the one or more non-linear estimation measurements.


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