The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 20, 2023
Filed:
Jul. 07, 2022
Arvind Agarwal, Miami, FL (US);
Darryl Dickerson, Miami, FL (US);
Lihua Lou, Miami, FL (US);
Mukesh Roy, Miami, FL (US);
Arvind Agarwal, Miami, FL (US);
Darryl Dickerson, Miami, FL (US);
Lihua Lou, Miami, FL (US);
Mukesh Roy, Miami, FL (US);
THE FLORIDA INTERNATIONAL UNIVERSITY BOARD OF TRUSTEES, Miami, FL (US);
Abstract
Systems and methods for multi-directional imaging in coupling with an indentation device are provided. The systems and methods can enable in situ multi-directional and full-field interfacial force response on soft matter. With more than two two-dimensional (2D) plane videos and/or images, the in situ nano-, micro-, and meso-scale time-dependent damage responses at the three-dimensional (3D) level can be constructed. Based on the obtained 2D and 3D videos and/or images, the underlying dynamic force response and fatigue mechanisms can be observed using a digital image correlation technique.