The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 20, 2023

Filed:

Feb. 24, 2021
Applicant:

Ciena Corporation, Hanover, MD (US);

Inventors:

Antoine Bois, Québec, CA;

Alexandre Delisle-Simard, Québec, CA;

Marie-Josée Picard, L'Ancienne-Lorette, CA;

Michel Poulin, Québec, CA;

Assignee:

Ciena Corporation, Hanover, MD (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/07 (2013.01); H04B 10/079 (2013.01); G02B 6/12 (2006.01); H01S 5/0683 (2006.01); H04B 10/67 (2013.01);
U.S. Cl.
CPC ...
H04B 10/07955 (2013.01); G02B 6/12004 (2013.01); G02B 2006/1215 (2013.01); G02B 2006/12138 (2013.01); G02B 2006/12154 (2013.01); H01S 5/0683 (2013.01); H04B 10/07 (2013.01); H04B 10/07957 (2013.01); H04B 10/674 (2013.01); H04B 10/675 (2013.01);
Abstract

A loss-based wavelength meter includes a first photodiode configured to measure power of monochromatic light; and a loss section having a monotonic wavelength dependency, wherein a wavelength of the monochromatic light is determined based on measurements of the first photodiode after the monochromatic light has gone through the loss section. This provides a compact implementation that may be used in integrated optics devices using silicon photonics as well as other embodiments.


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