The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 20, 2023

Filed:

Sep. 29, 2020
Applicant:

Diftek Lasers, Inc., Waterloo, CA;

Inventor:

Douglas R. Dykaar, Waterloo, CA;

Assignee:

DIFTEK LASERS, INC., Waterloo, CA;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 33/06 (2010.01); H01L 33/00 (2010.01); H01L 33/20 (2010.01); H05K 1/09 (2006.01); H01L 21/02 (2006.01);
U.S. Cl.
CPC ...
H01L 33/06 (2013.01); H01L 33/005 (2013.01); H01L 33/20 (2013.01); H05K 1/09 (2013.01); H01L 21/02293 (2013.01); H05K 2201/10106 (2013.01); H05K 2203/1338 (2013.01);
Abstract

There are provided methods of growing arrays of light emitters on substrates. An example method includes adjusting a growth parameter of a given light emitter of an array of light emitters on a substrate to obtain an adjusted growth parameter. The adjusting may be based on a location of the given light emitter on the substrate. The adjusting may be to compensate for nonuniformity in a growth profile of the light emitters across the substrate. The nonuniformity may be associated with a corresponding nonuniformity among wavelengths of light generated by the light emitters. Adjusting the growth parameter may be to adjust the corresponding nonuniformity. The method may also include growing the given light emitter on the substrate based on the adjusted growth parameter. Arrays of corresponding light emitters are also described.


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