Inspection device and machine learning method

Abstract

Disclosed is an inspection device including: a machine learning device that performs machine learning on the basis of state data acquired from an inspection target and label data indicating an inspection result related to the inspection target to generate a learning model; a learning model evaluation index calculation unit that calculates a learning model evaluation index related to the learning model generated by the machine learning device as an evaluation index used to evaluate the learning model; an inspection index acquisition unit that acquires an inspection index used in an inspection; and an index value determination unit that determines whether the learning model generated by the machine learning device satisfies the inspection index on the basis of the learning model evaluation index and the inspection index and outputs a result of the determination.