The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 20, 2023

Filed:

Mar. 10, 2021
Applicant:

Doordash, Inc., San Francisco, CA (US);

Inventors:

Robert Bryant Kaspar, Berkeley, CA (US);

Alok Gupta, San Francisco, CA (US);

Aman Dhesi, San Francisco, CA (US);

Assignee:

DOORDASH, INC., San Francisco, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 30/02 (2023.01); G06Q 30/0242 (2023.01); G06N 20/00 (2019.01); G06F 18/21 (2023.01); G06F 18/214 (2023.01);
U.S. Cl.
CPC ...
G06Q 30/0244 (2013.01); G06F 18/217 (2023.01); G06F 18/2148 (2023.01); G06N 20/00 (2019.01);
Abstract

In some examples, a computing device may receive data from a plurality of groups of data sources. The computing device may create a training data set from a first portion of the received data and may create a plurality of validation data sets from a second portion of the received data. For example, each validation data set may correspond to a respective one of the groups of data sources. The computing device may train, using the training data set, a plurality of machine learning models configured for synthesizing data. For instance, respective ones of the machine learning models may correspond to respective ones of the groups of data sources. Further, the computing device may validate the respective machine learning models using the respective validation data set corresponding to the respective group to which the respective machine learning model being validated corresponds.


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