The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 20, 2023
Filed:
May. 26, 2022
Morgan Stanley Services Group Inc., New York, NY (US);
Jonathan Oakley, Woodruff, SC (US);
Joseph Edmonds, Ellicott City, MD (US);
Morgan Stanley Services Group Inc., New York, NY (US);
Abstract
A system for collecting data artifacts from a production environment, storing them, and replaying them in a testing environment is disclosed. One or more processors receive a data artifact from a sensor in a production environment, and store the data artifact in a first storage with a unique identifier, while also storing in a second storage record(s) associating the unique identifier with a tag. A clone of at least a portion of the production environment is created within the testing environment, and an analytic targeting the data artifact is incorporated into the clone. Upon receiving a request to replay the data artifact, referencing the tag associated with the data artifact's unique identifier, the data artifact is replayed by causing the clone to receive the data artifact as if it were presently encountered. Logs of output from the clone's response are stored in a third storage for future analysis.