The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 20, 2023
Filed:
Jun. 09, 2021
Business Objects Software Ltd., Dublin, IE;
Paul O'Hara, Dublin, IE;
Malte Christian Kaufmann, Dublin, IE;
Anirban Banerjee, Kilcullen, IE;
Ian Denver, Bray, IE;
Alan McShane, Raheny, IE;
BUSINESS OBJECTS SOFTWARE LTD., Dublin, IE;
Abstract
Systems and methods include determination, determine, for each of a plurality of discrete features, of statistics for each discrete value of the discrete feature based on values of a continuous feature associated with the discrete value, determination, for each discrete feature, of first summary statistics based on the statistics determined for each discrete value of the discrete feature, determination, for each discrete feature, of a dissimilarity based on the first summary statistics determined for the discrete feature and on the statistics determined for each discrete value of the discrete feature, determination of candidate discrete features of the discrete features based on the determined dissimilarities, the candidate discrete features comprising less than all of the discrete features, determination, for each of the candidate discrete features, of second summary statistics based on values of the continuous feature associated with each discrete value of the candidate discrete feature, determine of a deviation score for each of the candidate discrete features based on the second summary statistics, and presentation of the candidate discrete features based on the determined deviation scores.