The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 20, 2023

Filed:

Jan. 29, 2021
Applicant:

The Regents of the University of California, Oakland, CA (US);

Inventors:

Marwen Zorgui, Irvine, CA (US);

Mohammed Fouda, Irvine, CA (US);

Ahmed M. Eltawil, Irvine, CA (US);

Zhiying Wang, Irvine, CA (US);

Fadi Kurdahi, Irvine, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/10 (2006.01); G11C 13/00 (2006.01); H03M 13/15 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1068 (2013.01); G11C 13/0002 (2013.01); H03M 13/1575 (2013.01);
Abstract

Disclosed are various approaches for a controller that can generate and use non-stationary polar codes for encoding and decoding information. In one example, a method includes performing, by an encoder of the controller, a linear operation on at least one vector of information to be stored in a memory. The linear operation includes generating a polar encoded representation from the at least one vector of information. The linear operation also includes generating an output using at least one permutation that is based on a statistical characterization analysis of channels of the memory and a channel dependent permutation that is applied to the polar encoded representation. In some aspects, the statistical characterization analysis includes a respective reliability level of each one of the plurality of channels, and the channel dependent permutation includes an ordered permutation that orders the channels according to their respective reliability level.


Find Patent Forward Citations

Loading…