The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 20, 2023

Filed:

Sep. 23, 2020
Applicant:

Hewlett Packard Enterprise Development Lp, Houston, TX (US);

Inventor:

Matti Vanninen, Cary, NC (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0641 (2013.01); G06F 3/0608 (2013.01); G06F 3/0629 (2013.01); G06F 3/0673 (2013.01);
Abstract

In some examples, a system computes respective values for corresponding data value indicators added to and removed from a deduplication data store in which duplicated data values have been eliminated, where each respective data value indicator of the data value indicators represents presence of a unique data value in the deduplication data store. The system updates an estimator based on the respective values, to reflect an addition of a first data value indicator to the deduplication data store and a removal of a second data value indicator from the deduplication data store. The system computes, using the updated estimator, a parameter relating to data deduplication at the deduplication data store.


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Vanninen, Matti. (2023). Data deduplication parameter computation (U.S. Patent No. 11681453). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11681453

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