The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 20, 2023

Filed:

May. 25, 2021
Applicant:

Creating Nano Technologies, Inc., Tainan, TW;

Inventors:

Ji-Yung Lee, Tainan, TW;

Andrew Ronaldi Tandio, Tainan, TW;

Hung-Chan Chiang, Tainan, TW;

Bo-Fan Tsai, Tainan, TW;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 29/22 (2006.01); G01R 29/12 (2006.01); H10N 30/045 (2023.01); H10N 30/857 (2023.01); H10N 30/853 (2023.01);
U.S. Cl.
CPC ...
G01R 29/22 (2013.01); G01R 29/12 (2013.01); H10N 30/045 (2023.02); H10N 30/857 (2023.02); H10N 30/8554 (2023.02);
Abstract

A method for monitoring polarization quality of a piezoelectric film is described. In this method, a detection step is performed on a piezoelectric film by using a detection device with a non-contact method during a polarization process of the piezoelectric film, to obtain a static electricity information or a transmittance information. A determination step is performed by using the static electricity information or the transmittance information to determine a polarization degree of the piezoelectric film.


Find Patent Forward Citations

Lee, Ji-Yung. (2023). Method for monitoring polarization quality of piezoelectric film (U.S. Patent No. 11680974). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11680974

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…