The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 20, 2023

Filed:

Apr. 09, 2021
Applicant:

Rohde & Schwarz Gmbh & Co. KG, Munich, DE;

Inventors:

Benoit Derat, Munich, DE;

Adam Tankielun, Munich, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/302 (2006.01); G01R 29/08 (2006.01); H04B 17/12 (2015.01);
U.S. Cl.
CPC ...
G01R 29/0878 (2013.01); H04B 17/12 (2015.01);
Abstract

A method of performing a measurement of a device under test by using an antenna array. The method includes: providing an antenna array that includes several antenna elements; providing a device under test configured to communicate over-the-air; locating the device under test at a first test location, thereby establishing a first relative distance between the device under test and the antenna array; performing a first measurement over-the-air when the first relative distance is provided between the device under test and the antenna array, thereby obtaining first measurement results; moving the antenna array and/or the device under test, thereby establishing a second relative distance between the device under test and the antenna array; and performing a second measurement over-the-air when the second relative distance is provided between the device under test and the antenna array, thereby obtaining second measurement results, wherein a quiet zone is established, in which the device under test is located, and wherein the size of the quiet zone is derived from a combination of at least two transfer functions associated with the first measurement results and the second measurement results. Further, a measurement system is described.


Find Patent Forward Citations

Loading…