The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 20, 2023

Filed:

Aug. 28, 2019
Applicant:

Sysmex Corporation, Kobe, JP;

Inventors:

Kohei Oda, Kobe, JP;

Hironori Katsumi, Kobe, JP;

Assignee:

SYSMEX CORPORATION, Kobe, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/04 (2006.01); G01N 35/10 (2006.01); G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
G01N 35/04 (2013.01); G01N 35/0095 (2013.01); G01N 35/00732 (2013.01); G01N 35/1004 (2013.01); G01N 35/1079 (2013.01); G01N 2035/00752 (2013.01); G01N 2035/00891 (2013.01); G01N 2035/0413 (2013.01);
Abstract

A sample analyzer includes a suction unit configured to suction a sample in a sample container through a stopper installed in an opening of the sample container; a rack transport unit configured to transport a sample rack holding a sample container along a transport path, and position the sample container held by the sample rack at a suction position by the suction unit; a sample transport unit in which a sample container other than the sample container transported by the rack transport unit is installed and which is configured to transport the installed sample container to the suction position provided on the transport path; a measurement unit configured to measure a sample suctioned by the suction unit from the sample container positioned at the suction position; and an analysis unit configured to analyze the sample based on the measurement result of the measurement unit.


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