The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 20, 2023

Filed:

May. 07, 2019
Applicant:

Viavi Solutions Inc., San Jose, CA (US);

Inventors:

Changmeng Hsiung, Redwood City, CA (US);

Christopher G. Pederson, Santa Rosa, CA (US);

Peng Zou, Ridgefield, CT (US);

Lan Sun, Santa Rosa, CA (US);

Assignee:

VIAVI Solutions Inc., Chandler, AZ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/48 (2006.01); G01N 33/50 (2006.01); G01N 21/31 (2006.01); G06N 20/00 (2019.01); G16C 20/20 (2019.01); G06N 20/10 (2019.01); G06N 7/01 (2023.01); G16C 20/70 (2019.01);
U.S. Cl.
CPC ...
G01N 21/31 (2013.01); G06N 7/01 (2023.01); G06N 20/00 (2019.01); G06N 20/10 (2019.01); G16C 20/20 (2019.02); G16C 20/70 (2019.02);
Abstract

A device may receive information identifying results of a spectroscopic measurement of an unknown sample. The device may perform a first classification of the unknown sample based on the results of the spectroscopic measurement and a global classification model. The device may generate a local classification model based on the first classification. The device may perform a second classification of the unknown sample based on the results of the spectroscopic measurement and the local classification model. The device may provide information identifying a class associated with the unknown sample based on performing the second classification.


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