The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 20, 2023
Filed:
Feb. 21, 2019
Ihi Inspection and Instrumentation Co., Ltd., Tokyo, JP;
Seiichi Ohmori, Yokahama, JP;
Mami Ohmori, Yokohama, JP;
Hideyuki Nakamura, Yokohama, JP;
Hiraku Kawasaki, Yokohama, JP;
IHI Inspection and Instrumentation Co., Ltd., Tokyo, JP;
Abstract
A tensile load is applied to the test body to increase with time, and an AE wave displacement in the test body is detected (step S). From the detected AE wave, waveform data are generated for each time section (step S). For each section, from the waveform data, spectrum data are generated (step S), a peak of an intensity in the spectrum data is specified, a data part in which an intensity is at least a value of a set percentage of the peak in the spectrum data is extracted as processing target data (step S), and from the processing target data, the most frequent value of frequency gravity centers is specified (step S). The most frequent value for each section and a tensile load applied to the test body in each section are output as strength evaluation data for evaluating a tensile strength of the test body (step S).