The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 20, 2023

Filed:

Mar. 19, 2020
Applicant:

Industrial Technology Research Institute, Hsinchu, TW;

Inventors:

Chen-Hui Kuo, Taichung, TW;

Tian-You Hou, Kaohsiung, TW;

Jia-Cheng Sun, Changhua County, TW;

Chen-Yu Kai, Pingtung County, TW;

Yung-Chih Lin, Taichung, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B23Q 17/22 (2006.01); B23Q 17/10 (2006.01);
U.S. Cl.
CPC ...
B23Q 17/2233 (2013.01); B23Q 17/10 (2013.01);
Abstract

This disclosure provides a machine tool adjustment method and system thereof. The machine tool adjustment method includes the following steps: enabling a machine tool to perform a circular test; obtaining a measured error value Efrom a measuring instrument, and the measured error value Eis defined by the difference between the actual circular trajectory and the preset circular trajectory during the circular test; determining an error condition of the tool machine from the measured error value E; determining whether the error condition is less than a predetermined criteria; if not, defining a compensation parameter according to the error condition and enabling the machine tool to perform another circular test according to the set compensation parameter until the error condition is less than the predetermined criteria; and if yes, ending the circular test and the machine tool adjustment is finished.


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