The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 20, 2023
Filed:
Oct. 29, 2019
Roxanne Abul-haj, Sedona, AZ (US);
Kevin Hazen, Flagstaff, AZ (US);
Christopher Slawinski, Mesa, AZ (US);
Alan Abul-haj, Sedona, AZ (US);
Roxanne Abul-Haj, Sedona, AZ (US);
Kevin Hazen, Flagstaff, AZ (US);
Christopher Slawinski, Mesa, AZ (US);
Alan Abul-Haj, Sedona, AZ (US);
Other;
Abstract
The invention comprises an applied force-optic analyzer used to determine a sample constituent concentration, a physical measure of the sample, and/or a state of the sample. The analyzer comprises: an electro-mechanical transducer affixed to skin of a subject; a controller, the controller providing a voltage waveform to the electro-mechanical transducer driving displacement of the skin and inducing a pressure wave into the skin; and a spectrometer interfaced to a sample site of the skin, the spectrometer comprising a set of sources and a set of detectors, where the controller is configured to collect signal from the set of detectors as a function of timing of the voltage waveform and apply a calibration model to the signal to determine the analyte concentration.