The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 13, 2023

Filed:

Jun. 15, 2020
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Joonggyu Kim, Suwon-si, KR;

Minhyuk Lee, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/52 (2006.01); H04N 25/40 (2023.01); H04N 23/81 (2023.01); G01N 21/88 (2006.01);
U.S. Cl.
CPC ...
H04N 25/40 (2023.01); H04N 5/52 (2013.01); H04N 23/811 (2023.01); G01N 21/88 (2013.01);
Abstract

Provided are an electronic system, an image system, and a method for measuring particulate matter. The electronic system includes an illuminator, a sensor and a processor. The illuminator outputs light. The sensor includes a pixel array to generate an analog signal based on scattered light according to the output light, and a converting circuit to convert the analog signal into digital signals respectively corresponding to gain values, based on the gain values. The processor counts the number of values greater than or equal to a threshold value among values of the digital signals, and calculates a concentration of particulate matter having a target size range, based on a variation in the counted number according to a change of the gain values.


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