The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 13, 2023

Filed:

Dec. 03, 2018
Applicant:

Mitsubishi Electric Corporation, Tokyo, JP;

Inventors:

Yusaku Ito, Tokyo, JP;

Yusuke Nakamatsu, Tokyo, JP;

Jun Tomisawa, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H02M 1/32 (2007.01); G01R 31/66 (2020.01); G01R 31/26 (2020.01); H01L 23/00 (2006.01); H01L 25/07 (2006.01); H01L 25/18 (2023.01); H02M 7/5387 (2007.01); H02P 27/08 (2006.01);
U.S. Cl.
CPC ...
H02M 1/32 (2013.01); G01R 31/26 (2013.01); G01R 31/66 (2020.01); H01L 24/48 (2013.01); H01L 24/49 (2013.01); H01L 25/072 (2013.01); H01L 25/18 (2013.01); H02M 7/53871 (2013.01); H01L 2224/48137 (2013.01); H01L 2224/48227 (2013.01); H01L 2224/49111 (2013.01); H01L 2224/49112 (2013.01); H02P 27/08 (2013.01);
Abstract

A semiconductor device improved in deterioration detection accuracy by using an inductance of a bonding wire. The semiconductor device includes a first conductor pattern formed on the insulating substrate, the main current of the semiconductor die device flowing through the first conductor pattern; a second conductor pattern formed on the insulating substrate for sensing the potential of the surface electrode of the semiconductor die device; a first bonding wire for connecting the surface electrode and the first conductor pattern; and a second bonding wire. Further, there is a voltage sensing unit which is connected to the first conductor pattern and the second conductor pattern to sense a potential difference between the first conductor pattern and the second conductor pattern at the time of switching of the semiconductor die device; and a deterioration detection unit for detecting deterioration of the first bonding wire by using the sensed potential difference.


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