The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 13, 2023

Filed:

Nov. 14, 2019
Applicant:

Hrl Laboratories, Llc, Malibu, CA (US);

Inventor:

Yuri Owechko, Newbury Park, CA (US);

Assignee:

HRL LABORATORIES, LLC, Malibu, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/75 (2022.01); H03H 21/00 (2006.01); G06T 7/90 (2017.01); G06T 7/62 (2017.01); G06F 18/23 (2023.01);
U.S. Cl.
CPC ...
G06V 10/751 (2022.01); G06T 7/62 (2017.01); G06T 7/90 (2017.01); H03H 21/0025 (2013.01); G06F 18/23 (2023.01); G06F 2218/08 (2023.01); H03H 2021/0034 (2013.01);
Abstract

Described a system for anomaly detection using anomaly cueing. In operation, an input image having two-dimensional (2D) image mixtures of primary components is reformatted into one-dimensional (1D) input signals. Blind source signal separation is used to separate the 1D input signals into separate output primary components, which are 1D output signals. The 1D output signals are reformatted into 2D spatially independent component output images. The system then calculates all possible pair product images of the 2D spatially independent component output images and corresponding signal-to-noise ratios. A pair product image is selected based on the peak signal-to-noise ratio and thresholded to identify anomalies in the pair product image. Several types of devices can then be controlled based on the identified anomalies in the pair product image.


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