The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 13, 2023

Filed:

Feb. 16, 2022
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Xiang Yu Yang, Xi'an, CN;

Deng Xin Luo, Xi'an, CN;

Zhong Fang Yuan, Xi'an, CN;

Yong Wang, Xi'an, CN;

Ye Wang, Xi'an, CN;

Wen Wang, Beijing, CN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06T 19/00 (2011.01); G06T 17/20 (2006.01); G06T 7/70 (2017.01);
U.S. Cl.
CPC ...
G06T 19/006 (2013.01); G06T 7/70 (2017.01); G06T 17/20 (2013.01);
Abstract

Mechanisms are provided for generating an augmented reality representation of a real-world environment. An augmented reality (AR) system receives a captured digital image of the real-world environment and generates an initial estimate of a candidate point specifying an estimated location of an annotation point of a virtual object model within the captured digital image of the real-world environment. An accuracy of the initial estimate is calculated based on a function of characteristics of the annotation point and a function of characteristics of the candidate point and, in response to the evaluation of accuracy indicating that the initial estimate is not accurate, an annotation point location refinement operation is performed to generate a refined candidate point for aligning the annotation point with the captured digital image of the real-world environment. An AR representation of the real-world environment is generated based on the refined candidate point.


Find Patent Forward Citations

Loading…