The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 13, 2023

Filed:

Jul. 31, 2020
Applicant:

Novatek Microelectronics Corp., Hsinchu, TW;

Inventors:

Chih-Yu Chu, Kaohsiung, TW;

Po-Yuan Hsieh, Hsinchu, TW;

Chieh-En Lee, Taipei, TW;

Chung-Hao Tien, New Taipei, TW;

Shih-Hsuan Chen, Hsinchu, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/20 (2006.01); G06T 7/00 (2017.01); G06T 7/11 (2017.01); G06V 10/25 (2022.01); G06F 18/22 (2023.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G06F 18/22 (2023.01); G06T 5/20 (2013.01); G06T 7/11 (2017.01); G06T 2207/30168 (2013.01); G06V 10/25 (2022.01);
Abstract

A method and an image processing device for mura detection on a display are proposed. The method includes the following steps. An original image of the display is received and segmented into region of interest (ROI) patches. A predetermined range of spatial frequency components are filtered out from the ROI patches to generate filtered ROI patches. A mura defect is identified from the display according to the filtered ROI patches and predetermined mura patterns.


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Chu, Chih-Yu. (2023). Method and image processing device for mura detection on display (U.S. Patent No. 11676265). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11676265

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