The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 13, 2023
Filed:
Jan. 13, 2021
Oracle International Corporation, Redwood Shores, CA (US);
Amit Vaid, Bengaluru, IN;
Karthik Gvd, Bangalore, IN;
Vijayalakshmi Krishnamurthy, Sunnyvale, CA (US);
Vidya Mani, Bangalore, IN;
Oracle International Corporation, Redwood Shores, CA (US);
Abstract
Techniques for identifying anomalous multi-source data points and ranking the contributions of measurement sources of the multi-source data points are disclosed. A system obtains a data point including a plurality of measurements from a plurality of sources. The system determines that the data point is an anomalous data point based on a deviation of the data point from a plurality of additional data points. The system determines a contribution of two or more measurements, from the plurality of measurements, to the deviation of the data point from the plurality of additional data points. The system ranks the at least the two or more measurements, from the plurality of measurements, based on the respective contribution of each of the two or more measurements to the deviation of the anomalous data point from the plurality of prior data points.