The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 13, 2023

Filed:

Jul. 01, 2019
Applicant:

Nec Laboratories America, Inc., Princeton, NJ (US);

Inventors:

Masanao Natsumeda, Princeton Junction, NJ (US);

Wei Cheng, Princeton Junction, NJ (US);

Haifeng Chen, West Windsor, NJ (US);

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
G06F 11/008 (2013.01);
Abstract

A failure prediction system is provided. The system includes a model-based signature generator generating feature vectors from individual attributes of multi-variate time series data based on sequence importance and attribute importance. The system further includes a knowledge database storing feature vectors corresponding to a set of different failure types. The system also includes a set of similarity detectors. Each detect any of the feature vectors generated by the model-based signature generator that are similar to any of the feature vectors corresponding to a respective one of the different failure types stored in the knowledge database based on a similarity threshold and output the respective one of the different failure types and a likely time period when the respective one of the different failure types will occur.


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