The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 13, 2023
Filed:
Apr. 30, 2021
Splunk Inc., San Francisco, CA (US);
Jared Breeden, Melbourne, FL (US);
Steven Karis, San Mateo, CA (US);
Amin Moshgabadi, San Diego, CA (US);
Siri Singamneni, Milpitas, CA (US);
Rebecca Tortell, Los Altos, CA (US);
Joshua Vertes, San Diego, CA (US);
SPLUNK INC., San Francisco, CA (US);
Abstract
Systems and methods are described for providing a user interface for display of metric data. A plurality of graphical controls can be displayed in the user interface to modify the generation of the metric data. For example, a first graphical control may enable a user to specify a processing criterion and a second graphical control may enable a user to specify an aggregation criterion and a grouping criterion. Based on the aggregation criterion, aggregated data can be generated from data processed using the processing criterion. The grouping criterion can be used to extract metric data from the aggregated data and a preview of the metric data can be displayed in the user interface.