The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 13, 2023

Filed:

Dec. 02, 2020
Applicant:

Hoya Corporation, Tokyo, JP;

Inventor:

Takeshi Yamazaki, Tokyo, JP;

Assignee:

HOYA CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 5/20 (2006.01); G02B 5/28 (2006.01);
U.S. Cl.
CPC ...
G02B 5/208 (2013.01); G02B 5/282 (2013.01);
Abstract

Provided is a near-infrared cut-off filter having excellent oblique incidence characteristics due to extremely low dependence on the angle of incidence, and a low transmittance in a wavelength region of 1000 nm or more. More particularly, the near-infrared cut-off filter includes a transparent substrate that is formed of glass containing iron atoms and has a half-value wavelength of greater than 630 nm on a long wavelength side of a transmittance curve and an average transmittance of 1% or less in a wavelength region of 1000 to 1200 nm; and a resin layer formed on at least one main surface of the transparent substrate to absorb light of a specific wavelength.


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