The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 13, 2023

Filed:

May. 19, 2021
Applicant:

SK Hynix Inc., Gyeonggi-do, KR;

Inventors:

Hak Soon Kim, Gyeonggi-do, KR;

Han Sang Kim, Gyeonggi-do, KR;

Jeong Eun Song, Gyeonggi-do, KR;

Min Seok Shin, Gyeonggi-do, KR;

Assignee:

SK hynix Inc., Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 17/36 (2006.01); G06T 7/521 (2017.01); G01S 7/4911 (2020.01); G01S 17/894 (2020.01); H04N 25/705 (2023.01);
U.S. Cl.
CPC ...
G01S 17/36 (2013.01); G01S 7/4911 (2013.01); G01S 17/894 (2020.01); G06T 7/521 (2017.01); H04N 25/705 (2023.01);
Abstract

An image sensing device includes an optical emitter outputting a modulated signal to a target object; an optical receiver generating, according to a phase control signal, pixel signals corresponding to a reflected signal from the target object; an image processor calculating a depth phase based on the pixel signals and compensating for the depth phase according to a phase offset signal to output a depth information signal; a driving control circuit generating the phase control signal corresponding to a phase of the modulated signal and setting an initial phase difference between the modulated signal and the phase control signal according to the phase offset signal; and an offset calculating circuit setting a plurality of reference phases, selecting a reference phase closest to the depth phase among the set reference phases and generating the phase offset signal representing a phase difference between the selected reference phase and the depth phase.


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