The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 13, 2023

Filed:

Jun. 28, 2021
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Junghyun Park, Seoul, KR;

Jungwoo Kim, Hwaseong-si, KR;

Byunggil Jeong, Anyang-si, KR;

Changgyun Shin, Anyang-si, KR;

Byounglyong Choi, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 7/481 (2006.01); G02F 1/01 (2006.01); G02F 1/19 (2019.01); G01S 17/89 (2020.01); G01S 17/90 (2020.01);
U.S. Cl.
CPC ...
G01S 7/4817 (2013.01); G01S 17/89 (2013.01); G01S 17/90 (2020.01); G02F 1/0102 (2013.01); G02F 1/0121 (2013.01); G02F 1/19 (2013.01);
Abstract

A beam scanning apparatus includes a light source configured to emit light, and a reflective phased array device configured to reflect the light emitted from the light source and incident on the reflective phased array device, and electrically adjust a reflection angle of the reflected light reflected by the reflective phased array device, wherein the light source and the reflective phased array device are disposed such the light is incident on the reflective phased array device at an incidence angle with respect to a normal of a reflective surface of the reflective phased array device.


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