The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 13, 2023

Filed:

Dec. 14, 2021
Applicant:

Electdis Ab, Malmö, SE;

Inventor:

Laurens Swaans, Malmö, SE;

Assignee:

ElectDis AB, Malmö, SE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/40 (2020.01); H04B 17/17 (2015.01); H02J 50/60 (2016.01); H02J 50/40 (2016.01);
U.S. Cl.
CPC ...
G01R 31/40 (2013.01); H02J 50/40 (2016.02); H02J 50/60 (2016.02); H04B 17/17 (2015.01);
Abstract

A method () is disclosed for testing of wireless power transfer equipment () that has a plurality of wireless power transmitters (-) adapted for concurrent wireless power transfer to respective wireless power receiver devices (). The method comprises providing () a number of slave test devices (-), and providing () a master test device () in communicative connection with the slave test devices (-). The method further comprises arranging () each slave test device (-) in a position suitable for receiving power from a respective one of the wireless power transmitters (-) of the wireless power transfer equipment () under test, and commanding (-), by the master test device (), the slave test devices (-) to perform respective test procedures (-) upon the respective wireless power transmitters (-) while being in concurrent operation. Finally, the method comprises receiving (-), by the master test device (), result data (-) from the respective test procedures (-) performed by the slave test devices (-), and providing () an output () by the master test device (), the output () being based on the respective result data (-) obtained from the slave test devices (-).


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