The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 13, 2023

Filed:

May. 01, 2020
Applicant:

Rohde & Schwarz Gmbh & Co. KG, Munich, DE;

Inventor:

Bernhard Sterzbach, Munich, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/067 (2006.01); G06T 7/70 (2017.01);
U.S. Cl.
CPC ...
G01R 1/06794 (2013.01); G06T 7/70 (2017.01);
Abstract

A measurement system is described. The measurement system comprises a measurement device and a probe unit, wherein the measurement device comprises an image analysis circuit or module. The probe unit comprises at least one image sensor, wherein the at least one image sensor is connected to the image analysis module in a signal transmitting manner. The image sensor is configured to capture an image of a measurement area being associated with a device under test. The image analysis module is configured to analyze the image captured and to determine at least one characteristic quantity of the image captured via an image analysis technique. The image analysis module is further configured to gather an information concerning a test position of the probe unit from the at least one characteristic quantity. Further, a method for operating a measurement system is described.


Find Patent Forward Citations

Sterzbach, Bernhard. (2023). Measurement system and method for operating a measurement system (U.S. Patent No. 11674978). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11674978

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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