The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 13, 2023
Filed:
Feb. 07, 2022
Honda Motor Co., Ltd., Tokyo, JP;
HONDA MOTOR CO., LTD., Tokyo, JP;
Abstract
The present invention provides an X-ray diffraction measurement apparatus configured to measure properties of an object to be measured M based on X-ray diffraction generated by the object to be measured at an intersection position between an incident optical axis and outgoing optical axes, the X-ray diffraction measurement apparatus including: three slits of a linear shape through which X-rays pass and that are arranged so as to be inclined in an axial direction of the outgoing optical axis; a first two-dimensional detector and a second two-dimensional detector that detect the X-rays passing through the slits within a detection region; and a profile calculator that calculates diffraction profiles indicating intensities of the passing X-rays detected by the two-dimensional detectors, for each of the passing X-rays, thereby being capable of simultaneously obtaining measurement results relating to properties of a plurality of materials having different diffraction angles.