The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 13, 2023

Filed:

Mar. 11, 2022
Applicant:

1087 Systems, Inc., Cambridge, MA (US);

Inventor:

Matthias Wagner, Cambridge, MA (US);

Assignee:

1087 SYSTEMS, INC., Cambridge, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 15/14 (2006.01); G01N 21/3577 (2014.01); G02B 21/00 (2006.01); G01N 21/39 (2006.01); G01N 21/53 (2006.01); G01N 15/06 (2006.01); G01N 15/00 (2006.01); G01N 21/35 (2014.01); G01N 21/3581 (2014.01); G01N 21/552 (2014.01); G01N 15/10 (2006.01);
U.S. Cl.
CPC ...
G01N 15/1436 (2013.01); G01N 15/00 (2013.01); G01N 15/06 (2013.01); G01N 15/147 (2013.01); G01N 15/1434 (2013.01); G01N 15/1475 (2013.01); G01N 21/35 (2013.01); G01N 21/3577 (2013.01); G01N 21/39 (2013.01); G01N 21/53 (2013.01); G02B 21/006 (2013.01); G02B 21/008 (2013.01); G02B 21/0032 (2013.01); G02B 21/0036 (2013.01); G02B 21/0064 (2013.01); G01N 21/3581 (2013.01); G01N 21/552 (2013.01); G01N 2015/0065 (2013.01); G01N 2015/0687 (2013.01); G01N 2015/0693 (2013.01); G01N 2015/1006 (2013.01); G01N 2015/1443 (2013.01); G01N 2015/1447 (2013.01); G01N 2015/1488 (2013.01); G01N 2015/1497 (2013.01); G01N 2021/399 (2013.01); G01N 2201/068 (2013.01); G01N 2201/105 (2013.01);
Abstract

An analyzer of a component in a sample fluid includes an optical source and an optical detector defining a beam path of a beam, wherein the optical source emits the beam and the optical detector measures the beam after partial absorption by the sample fluid, a fluid flow cell disposed on the beam path defining an interrogation region in the a fluid flow cell in which the optical beam interacts with the sample fluid and a reference fluid; and wherein the sample fluid and the reference fluid are in laminar flow, and a scanning system that scans the beam relative to the laminar flow within the fluid flow cell, wherein the scanning system scans the beam relative to both the sample fluid and the reference fluid.


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