The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 13, 2023

Filed:

May. 27, 2021
Applicant:

Beijing Institute of Technology, Beijing, CN;

Inventors:

Chunguang Xu, Beijing, CN;

Shuangyi Li, Beijing, CN;

Zhaowei Miao, Beijing, CN;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/04 (2006.01); G01N 3/08 (2006.01);
U.S. Cl.
CPC ...
G01N 3/04 (2013.01); G01N 3/08 (2013.01); G01N 2203/0003 (2013.01); G01N 2203/0017 (2013.01); G01N 2203/0019 (2013.01); G01N 2203/0098 (2013.01); G01N 2203/0258 (2013.01); G01N 2203/0268 (2013.01); G01N 2203/0423 (2013.01); G01N 2203/0658 (2013.01); G01N 2203/0676 (2013.01);
Abstract

A Bauschinger effect test fixture that cooperates with a test machine for stretching and compressing materials to perform a Bauschinger effect test on a test piece having a symmetrical configuration with two wide ends and a narrow middle part. The fixture includes two identical split bodies, where each split body has a base provided, longitudinally from a central part to one end of the base, with a limiting groove corresponding to a half of the profile of the test piece. Two sides of the groove are arranged symmetrically with a plurality of threaded through holes and a cover is provided along its central axis with two threaded through holes with which the test piece is pressed tightly by bolts. An end of the cover corresponding to a notch of the limiting groove is provided with a through groove configured for placing a stress ultrasonic detection probe on the test piece.


Find Patent Forward Citations

Loading…