The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 13, 2023
Filed:
Dec. 28, 2020
Kyocera Document Solutions Inc., Osaka, JP;
Masaaki Nishihara, Osaka, JP;
KYOCERA Document Solutions Inc., Osaka, JP;
Abstract
A measurement method of nozzle overlapping width, in a main scanning direction intersecting a conveying direction of a recording medium, in an inkjet recording apparatus including a plurality of heads each having a plurality of nozzles that eject ink, includes a first step (S), a second step (S), and a third step (S). The first step (S) includes forming an image for measurement on the recording medium, using image data including combination patterns of droplet sizes, different with respect to each of blocks extending along the main scanning direction. The second step (S) includes selecting the block having uniform density along the main scanning direction, in the image for measurement. The third step (S) includes determining the nozzle overlapping width using a droplet size ratio adopted to form the image for measurement, on a basis of a position of the selected block.