The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 13, 2023

Filed:

Sep. 20, 2017
Applicant:

U.s.a. As Represented BY the Administrator of the Nasa, Washington, DC (US);

Inventors:

Tyler B. Hudson, Suffolk, VA (US);

Fuh-Gwo Yuan, Cary, NC (US);

Brian W. Grimsley, Williamsburg, VA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B29C 70/54 (2006.01); B29C 70/08 (2006.01); B29C 70/88 (2006.01); B29C 70/34 (2006.01); H01L 41/08 (2006.01); B29C 70/52 (2006.01); B29C 35/02 (2006.01); B29C 70/44 (2006.01); H10N 30/00 (2023.01);
U.S. Cl.
CPC ...
B29C 70/549 (2021.05); B29C 35/0288 (2013.01); B29C 70/08 (2013.01); B29C 70/342 (2013.01); B29C 70/44 (2013.01); B29C 70/528 (2013.01); B29C 70/546 (2013.01); B29C 70/88 (2013.01); H10N 30/1061 (2023.02); H10N 30/1071 (2023.02); B29C 35/0261 (2013.01);
Abstract

A method of monitoring a curing process for fiber reinforced composite materials that includes positioning an actuator on uncured composite material at a first location. At least one sensor is positioned at a second location that is spaced apart from the first location. The actuator excites waves in the composite part at the first location. At least one sensor is positioned at a second location that is spaced apart from the first location. The actuator excites waves in the composite part at the first location. The waves propagate through the composite part due to internal reflection. At least one wave metric is measured at the second location utilizing the sensor. At least one parameter of the curing process may be adjusted based, at least in part, on a wave metric measured by the sensor.


Find Patent Forward Citations

Loading…