The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 13, 2023
Filed:
Apr. 06, 2021
Huazhong University of Science and Technology, Hubei, CN;
Pan Gong, Hubei, CN;
Huaping Ding, Hubei, CN;
Xinyun Wang, Hubei, CN;
Junsong Jin, Hubei, CN;
Lei Deng, Hubei, CN;
Mao Zhang, Hubei, CN;
Xuefeng Tang, Hubei, CN;
HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY, Hubei, CN;
Abstract
The invention belongs to the field of amorphous alloys, and more specifically, relates to a method for calibrating the internal temperature field of amorphous alloy prepared by spark plasma sintering. First, the part required for temperature field calibration inside the bulk amorphous alloy sample obtained by spark plasma sintering is cut into a series of small amorphous alloy samples, and the isothermal crystallization treatment is performed to obtain the crystallization time of different parts of the sample. An annealing-isothermal crystallization experiment is performed on the adopted amorphous alloy powder at different annealing temperatures, and the functional relationship between the annealing temperature and the crystallization time is obtained. The crystallization time of different parts inside the amorphous alloy sample is substituted into this functional relationship, the temperature distribution during the temperature holding stage during the sintering of different parts inside the amorphous alloy sample can be obtained.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile