The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 13, 2023

Filed:

Mar. 27, 2018
Applicant:

Sichuan University, Sichuan, CN;

Inventors:

Haiyang Yu, Sichuan, CN;

Zhaozhao Chen, Sichuan, CN;

Xi Chen, Sichuan, CN;

Assignee:

SICHUAN UNIVERSITY, Chengdu, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61C 19/05 (2006.01); A61B 34/10 (2016.01); A61B 5/00 (2006.01); A61C 19/04 (2006.01);
U.S. Cl.
CPC ...
A61C 19/05 (2013.01); A61B 5/4547 (2013.01); A61B 34/10 (2016.02); A61C 19/04 (2013.01); A61B 2034/105 (2016.02); A61B 2034/108 (2016.02);
Abstract

A measuring system for analysis of space for dental implant restoration comprises a first measuring assembly for measuring a mouth opening degree and a first gap of plural missing teeth, a second measuring assembly for measuring a second gap of a single missing tooth and an occlusal distance, and a third measuring assembly for measuring a transgingival depth, wherein each of the first measuring assembly, the second measuring assembly and the third measuring assembly comprises a connecting rod and a measuring head disposed at an upper end of the connecting rod. A measuring method for analysis of space for dental implant restoration using the aforesaid measuring system for analyzing is further disclosed.


Find Patent Forward Citations

Yu, Haiyang. (2023). Measuring system and method for analysis of space for dental implant restoration (U.S. Patent No. 11672634). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11672634

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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