The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 13, 2023

Filed:

Jan. 18, 2018
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventor:

Fumiaki Tanaka, Kyoto, JP;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
A61B 6/5217 (2013.01); A61B 6/481 (2013.01); A61B 6/507 (2013.01); A61B 5/4848 (2013.01); A61B 6/40 (2013.01); A61B 6/4233 (2013.01); A61B 6/5205 (2013.01);
Abstract

An X-ray imaging apparatus includes an X-ray irradiation element, an X-ray detection element, an X-ray image generation element, and an image processing analysis element. The image processing analysis element reflects the analysis point on each frame based on a respective relative location between a characteristic pointof the X-ray image consisting of a plurality of frames. In addition, an image analysis element analyzes the time-course variation of the blood flow in the blood vessel of the heart based on the variation of the pixel value at the analysis point of each frame of the X-ray image.


Find Patent Forward Citations

Tanaka, Fumiaki. (2023). X-ray imaging apparatus and method of x-ray image analysis (U.S. Patent No. 11672499). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11672499

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