The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 06, 2023

Filed:

Dec. 17, 2021
Applicant:

Rohde & Schwarz Gmbh & Co. KG, Munich, DE;

Inventors:

Andreas Ziegler, Munich, DE;

Detlef Schlager, Taufkirchen, DE;

Jens Naumann, Chemnitz, DE;

Sebastian Petzsch, Chemnitz, DE;

Thomas Kuhwald, Markt Schwaben, DE;

Andrew Schaefer, Oberhaching, DE;

Michael Grimm, Anzing, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2015.01); H04B 17/11 (2015.01); H04B 3/46 (2015.01);
U.S. Cl.
CPC ...
H04B 17/0085 (2013.01); H04B 3/46 (2013.01); H04B 17/11 (2015.01);
Abstract

The present disclosure provides a main measurement device for simultaneously measuring signals with at least one secondary measurement device, the main measurement device comprising a reference signal output port configured to couple to the at least one secondary measurement device, a reference signal generator coupled to the reference signal output port and configured to generate a reference signal, a measurement port configured to receive a signal to be measured, a trigger output port configured to couple to a trigger input port of the at least one secondary measurement device and to output a trigger signal, and a controllably switchable internal signal path configured to selectively couple the reference signal generator with the measurement port. Further, the present invention discloses a respective secondary measurement device, a respective measurement system, and a respective method.


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