The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 06, 2023

Filed:

Dec. 16, 2020
Applicants:

Kyoto University, Kyoto, JP;

Stanley Electric Co., Ltd., Tokyo, JP;

Inventors:

Susumu Noda, Kyoto, JP;

Tomoaki Koizumi, Tokyo, JP;

Kei Emoto, Tokyo, JP;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01S 5/11 (2021.01); H01S 5/185 (2021.01); H01S 5/20 (2006.01); H01S 5/042 (2006.01); H01S 5/343 (2006.01); H01S 5/32 (2006.01);
U.S. Cl.
CPC ...
H01S 5/2009 (2013.01); H01S 5/04253 (2019.08); H01S 5/04254 (2019.08); H01S 5/11 (2021.01); H01S 5/185 (2021.01); H01S 5/2086 (2013.01); H01S 5/2095 (2013.01); H01S 5/320225 (2019.08); H01S 5/320275 (2019.08); H01S 5/34333 (2013.01); H01S 2301/176 (2013.01); H01S 2304/04 (2013.01);
Abstract

A method for manufacturing a GaN-based surface-emitting laser by an MOVPE includes: (a) growing a first cladding layer with a {0001} growth plane; (b) growing a guide layer on the first cladding layer; (c) forming holes which are two-dimensionally periodically arranged within the guide layer; (d) etching the guide layer by ICP-RIE using a chlorine-based gas and an argon; (e) supplying a gas containing a nitrogen to cause mass-transport, and then supplying the group-III gas for growth, whereby a first embedding layer closing openings of the holes is formed to form a photonic crystal layer; and (f) growing an active layer and a second cladding layer on the first embedding layer, The step (d) includes a step of referring to already-obtained data on a relationship of an attraction voltage and a ratio of gases in the ICP-RIE with a diameter distribution of air holes embedded, and applying the attraction voltage and the ratio to the ICP-RIE.


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