The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 06, 2023

Filed:

Jul. 31, 2020
Applicant:

GE Precision Healthcare Llc, Milwaukee, WI (US);

Inventors:

Cyril Riddell, Issy-les-Moulineaux, FR;

Marion Savanier, Versailles, FR;

Emilie Chouzenoux, Paris, FR;

Jean-Christophe Pesquet, Romainvilliers, FR;

Assignee:

GE Precision Healthcare LLC, Milwaukee, WI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T 1/00 (2006.01); A61B 6/00 (2006.01); G06T 11/00 (2006.01); A61B 6/03 (2006.01);
U.S. Cl.
CPC ...
G06T 11/005 (2013.01); A61B 6/032 (2013.01); A61B 6/4208 (2013.01); A61B 6/5217 (2013.01); G06T 11/006 (2013.01); G06T 2210/41 (2013.01); G06T 2211/424 (2013.01);
Abstract

Systems and methods are provided for reprojection and back projection of objects of interest via homographic transforms, and particularly one-dimensional homographic transforms. In one example, a method may include acquiring imaging data corresponding to a plurality of divergent X-rays, assigning a single functional form to the plurality of divergent X-rays, determining, via a homographic transform, weights of interaction between a plurality of distribution samples and a plurality of X-ray detector bins based on the single functional form, and reconstructing an image based on the weights of interaction.


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