The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 06, 2023
Filed:
Aug. 26, 2021
Beijing Baidu Netcom Science and Technology Co., Ltd., Beijing, CN;
Yan Peng, Beijing, CN;
Xiang Long, Beijing, CN;
Shumin Han, Beijing, CN;
Honghui Zheng, Beijing, CN;
Zhuang Jia, Beijing, CN;
Xiaodi Wang, Beijing, CN;
Pengcheng Yuan, Beijing, CN;
Yuan Feng, Beijing, CN;
Bin Zhang, Beijing, CN;
Ying Xin, Beijing, CN;
BEIJING BAIDU NETCOM SCIENCE AND TECHNOLOGY CO., LTD., Beijing, CN;
Abstract
An object area measurement method and an apparatus are provided, relating to the computer vision and deep learning technology. The method includes acquiring an original image with a spatial resolution, the original image including a target object; acquiring an object identification model including at least two sets of classification models; generating one or more original image blocks based on the original image; performing operations on each original image block: scaling each original image block at at least two scaling levels to obtain scaled image blocks with at least two sizes, the scaled image blocks respectively corresponding to the at least two sets of classification models, and inputting the scaled image blocks into the object identification model to obtain an identification result of the target object; and determining an area of the target object based on the respective identification results of the one or more original image blocks and the spatial resolution.