The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 06, 2023
Filed:
Jun. 15, 2020
Walmart Apollo, Llc, Bentonville, AR (US);
Pranay Dugar, Udaipur, IN;
Souradip Chakraborty, Bengaluru, IN;
Walmart Apollo, LLC, Bentonville, AR (US);
Abstract
An automated planogram anomaly detection solution rapidly and reliably identifies mismatches between planograms and actual item placement. Examples receive a real time (RT) image of a shelf unit corresponding to at least a first portion of a planogram; detect, within the RT image, item boundaries for a plurality of items on the shelf unit and tag boundaries for a plurality of tags associated with the shelf unit; extract text from at least one tag; extract attributes from at least one item; map the extracted item attributes with the extracted tag text; detect, based at least on the map, a planogram anomaly; and based at least on detecting the planogram anomaly, generate a report identifying the planogram anomaly (e.g., a mismatch between a tag and an item). Some examples compare the RT image with a ground truth (GT) image to detect anomalies, for example empty space on the shelf unit.