The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 06, 2023

Filed:

Jul. 13, 2017
Applicant:

Nec Corporation, Tokyo, JP;

Inventor:

Masanao Natsumeda, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 16/28 (2019.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 16/285 (2019.01);
Abstract

A learning system including: a training data acquisition unit that, for each of a plurality of feature amounts obtained by converting time-series data on a predetermined period basis, acquires training data with which an event type in the predetermined period is associated; and a classifier learning unit that performs learning on a plurality of classifiers different from each other by using a feature amount group including one or more feature amounts corresponding to some or all periods out of the plurality of feature amounts included in the training data to perform learning on a classifier, which classifies the event type, for multiple times while changing a combination in the feature amount group, and the event type includes a first event type corresponding to a state where a target event to be classified occurs and a second event type corresponding to a state where the target event does not occur.


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