The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 06, 2023

Filed:

Dec. 15, 2020
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Yuki Itabayashi, Tokyo, JP;

Makoto Onodera, Tokyo, JP;

Yuuki Shimizu, Tokyo, JP;

Akira Kamei, Tokyo, JP;

Masayuki Hariya, Tokyo, JP;

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/10 (2020.01); G06F 111/02 (2020.01); G06F 30/15 (2020.01); G06F 111/10 (2020.01);
U.S. Cl.
CPC ...
G06F 30/10 (2020.01); G06F 30/15 (2020.01); G06F 2111/02 (2020.01); G06F 2111/10 (2020.01);
Abstract

A design support device includes a unit that accepts registration of normal CAD data with a past record and violation CAD data determined to have violated portion with respect to three-dimensional CAD data, a unit that acquires a parameter related to a design rule from CAD data to be evaluated, a unit that calculates a statistical value of the acquired parameter and calculates a value of an influence degree t that explains a violation of each parameter, and a unit that presents a scatter diagram plotting normal CAD data and violation CAD data to be evaluated and a boundary line subjected to cluster analysis, on a two-dimensional coordinate system, according to a combination of parameters designated by a user (evaluator).


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