The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 06, 2023

Filed:

Oct. 29, 2020
Applicant:

Emc Ip Holding Company Llc, Hopkinton, MA (US);

Inventors:

Suraj Brahma Raju, Issaquah, WA (US);

Max Laier, Seattle, WA (US);

Ronald Steinke, Tacoma, WA (US);

Assignee:

EMC IP HOLDING COMPANY LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/00 (2019.01); G06F 16/23 (2019.01); G06F 11/14 (2006.01);
U.S. Cl.
CPC ...
G06F 16/2379 (2019.01); G06F 11/1474 (2013.01); G06F 2201/82 (2013.01);
Abstract

Systems and methods facilitating fault tolerance for transaction mirroring are described herein. A method as described herein can include receiving a commit command for a data transaction from an initiator node of the system, wherein the data transaction is associated with a first failure domain, and wherein the commit command is directed to a primary participant node and a secondary participant node of the system; determining whether a response to the commit command has been received at the primary participant node from the secondary participant node in response to the receiving; and, in response to determining that the response to the commit command was not received at the primary participant node, indicating that the secondary participant node is invalid in a data store associated with a second failure domain that is distinct from the first failure domain.


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